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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM Softcover reprint of the original 2nd ed. 2016 edition
R.F. Egerton
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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM Softcover reprint of the original 2nd ed. 2016 edition
R.F. Egerton
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences.
196 pages, 15 Illustrations, color; 109 Illustrations, black and white; XI, 196 p. 124 illus., 15 il
| Mídia | Livros Paperback Book (Livro de capa flexível e brochura) |
| Lançado | 30 de maio de 2018 |
| ISBN13 | 9783319819860 |
| Editoras | Springer International Publishing AG |
| Páginas | 196 |
| Dimensões | 234 × 156 × 16 mm · 324 g |
| Idioma | German |
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