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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM R.F. Egerton 1st ed. 2005. Corr. 2nd printing 2011 edition
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Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
R.F. Egerton
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences.
216 pages, 122 black & white illustrations, 5 black & white tables, biography
| Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
| Lançado | 3 de agosto de 2005 |
| Data do lançamento original | 2008 |
| ISBN13 | 9780387258003 |
| Editoras | Springer-Verlag New York Inc. |
| Páginas | 202 |
| Dimensões | 155 × 235 × 14 mm · 430 g |
| Idioma | Inglês |
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