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Applied Scanning Probe Methods IV: Industrial Applications - NanoScience and Technology 2006 edition
Bharat Bhushan
Applied Scanning Probe Methods IV: Industrial Applications - NanoScience and Technology 2006 edition
Bharat Bhushan
Provides a comprehensive overview of SPM applications. The international perspective offered in these three volumes contributes to the evolution of SPM techniques. Volumes II, III and IV examine the physical and technical foundation for progress in applied near-field scanning probe techniques.
284 pages, 19 black & white tables, biography
Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
Lançado | 22 de fevereiro de 2006 |
ISBN13 | 9783540269120 |
Editoras | Springer-Verlag Berlin and Heidelberg Gm |
Páginas | 284 |
Dimensões | 155 × 235 × 17 mm · 576 g |
Idioma | English |
Editor | Bhushan, Bharat |
Editor | Fuchs, Harald |
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