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Applied Scanning Probe Methods III: Characterization - NanoScience and Technology 2006 edition
Bharat Bhushan
Applied Scanning Probe Methods III: Characterization - NanoScience and Technology 2006 edition
Bharat Bhushan
There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.
378 pages, 268 black & white illustrations, 2 colour illustrations, 3 black & white tables, biograph
Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
Lançado | 22 de fevereiro de 2006 |
ISBN13 | 9783540269090 |
Editoras | Springer-Verlag Berlin and Heidelberg Gm |
Páginas | 378 |
Dimensões | 166 × 243 × 21 mm · 716 g |
Idioma | German |
Editor | Bhushan, Bharat |
Editor | Fuchs, Harald |
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