
Conte aos seus amigos sobre este item:
From Contamination to Defects, Faults and Yield Loss: Simulation and Applications - Frontiers in Electronic Testing Softcover reprint of the original 1st ed. 1996 edition
Jitendra B. Khare
From Contamination to Defects, Faults and Yield Loss: Simulation and Applications - Frontiers in Electronic Testing Softcover reprint of the original 1st ed. 1996 edition
Jitendra B. Khare
Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.
150 pages, biography
Mídia | Livros Paperback Book (Livro de capa flexível e brochura) |
Lançado | 26 de setembro de 2011 |
ISBN13 | 9781461285953 |
Editoras | Springer-Verlag New York Inc. |
Páginas | 150 |
Dimensões | 155 × 235 × 9 mm · 249 g |
Idioma | English |
Ver tudo de Jitendra B. Khare ( por exemplo Hardcover Book e Paperback Book )