From Contamination to Defects, Faults and Yield Loss: Simulation and Applications - Frontiers in Electronic Testing - Jitendra B. Khare - Livros - Springer - 9780792397144 - 30 de abril de 1996
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From Contamination to Defects, Faults and Yield Loss: Simulation and Applications - Frontiers in Electronic Testing 1996 edition

Jitendra B. Khare

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From Contamination to Defects, Faults and Yield Loss: Simulation and Applications - Frontiers in Electronic Testing 1996 edition

Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.


150 pages, biography

Mídia Livros     Hardcover Book   (Livro com lombada e capa dura)
Lançado 30 de abril de 1996
ISBN13 9780792397144
Editoras Springer
Páginas 150
Dimensões 155 × 235 × 11 mm   ·   417 g
Idioma English