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From Contamination to Defects, Faults and Yield Loss: Simulation and Applications - Frontiers in Electronic Testing 1996 edition
Jitendra B. Khare
From Contamination to Defects, Faults and Yield Loss: Simulation and Applications - Frontiers in Electronic Testing 1996 edition
Jitendra B. Khare
Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.
150 pages, biography
Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
Lançado | 30 de abril de 1996 |
ISBN13 | 9780792397144 |
Editoras | Springer |
Páginas | 150 |
Dimensões | 155 × 235 × 11 mm · 417 g |
Idioma | English |
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