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Characterization Methods for Submicron MOSFETs - The Springer International Series in Engineering and Computer Science Softcover reprint of the original 1st ed. 1995 edition
Hisham Haddara
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Characterization Methods for Submicron MOSFETs - The Springer International Series in Engineering and Computer Science Softcover reprint of the original 1st ed. 1995 edition
Hisham Haddara
The need for more deep and extensive characterization of MOSFET param eters has further increased as the applications of this device have gained ground in many new fields in which its performance has become more and more sensi tive to the properties of its Si - Si0 interface.
232 pages, biography
| Mídia | Livros Paperback Book (Livro de capa flexível e brochura) |
| Lançado | 26 de setembro de 2011 |
| ISBN13 | 9781461285847 |
| Editoras | Springer-Verlag New York Inc. |
| Páginas | 232 |
| Dimensões | 155 × 235 × 13 mm · 358 g |
| Editor | Haddara, Hisham |
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