Conte aos seus amigos sobre este item:
Focused Ion Beam Systems: Basics and Applications
Nan Yao
Focused Ion Beam Systems: Basics and Applications
Nan Yao
This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Presenting the basic principles, capabilities, challenges, advantages, applications and when best to implement the technology, this is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.
408 pages, 196 b/w illus.
Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
Lançado | 13 de setembro de 2007 |
ISBN13 | 9780521831994 |
Editoras | Cambridge University Press |
Páginas | 408 |
Dimensões | 252 × 180 × 29 mm · 862 g |
Idioma | English |
Editor | Yao, Nan (Princeton University, New Jersey) |