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Focused Ion Beam Systems: Basics and Applications
Nan Yao
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Focused Ion Beam Systems: Basics and Applications
Nan Yao
This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Presenting the basic principles, capabilities, challenges, advantages, applications and when best to implement the technology, this is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.
408 pages, black & white illustrations
| Mídia | Livros Paperback Book (Livro de capa flexível e brochura) |
| Lançado | 14 de abril de 2011 |
| ISBN13 | 9780521158596 |
| Editoras | Cambridge University Press |
| Páginas | 408 |
| Dimensões | 169 × 246 × 24 mm · 668 g |
| Idioma | English |
| Editor | Yao, Nan (Princeton University, New Jersey) |
![Cover for Nan Yao · Handbook of Microscopy for Nanotechnology (Hardcover Book) [2005 edition] (2005)](https://imusic.b-cdn.net/images/item/original/036/9781402080036.jpg?nan-yao-2005-handbook-of-microscopy-for-nanotechnology-hardcover-book&class=scaled&v=1605674268)