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Data Mining and Diagnosing IC Fails - Frontiers in Electronic Testing 2005 edition
Leendert M. Huisman
Data Mining and Diagnosing IC Fails - Frontiers in Electronic Testing 2005 edition
Leendert M. Huisman
The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part.
250 pages, 46 black & white illustrations, biography
Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
Lançado | 21 de junho de 2005 |
ISBN13 | 9780387249933 |
Editoras | Springer-Verlag New York Inc. |
Páginas | 250 |
Dimensões | 155 × 235 × 15 mm · 576 g |
Idioma | English |
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