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Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling - Springer Series in Advanced Microelectronics Softcover reprint of the original 1st ed. 2016 edition
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Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling - Springer Series in Advanced Microelectronics Softcover reprint of the original 1st ed. 2016 edition
269 pages, 17 Tables, black and white; 67 Illustrations, color; 134 Illustrations, black and white;
| Mídia | Livros Paperback Book (Livro de capa flexível e brochura) |
| Lançado | 23 de outubro de 2016 |
| ISBN13 | 9788132234241 |
| Editoras | Springer, India, Private Ltd |
| Páginas | 269 |
| Dimensões | 493 g |
| Editor | Mahapatra, Souvik |