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Compton Profile Study of Technologically Important Materials Vimal Vyas
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Compton Profile Study of Technologically Important Materials
Vimal Vyas
The book highlights on the study of Compton Scattering Technique for semiconductors and alloys. Its First chapter is dedicated to Introduction of the techniques and literature survey as well. The second chapter is dedicated to Experimental details of the Compton Spectrometer. Third chapter highlighted the Compton Profile study of semiconducting material ZnSe, then fourth chapter is dedicated to electronic structure study of semiconducting materials AlN. The fifth chapter is devoted to Compton profile study of single crystalline Cu-Zn alloys for both alpha and beta phase in three principal directions. finally, last chapter is dedicated to conclusions and future scope. Overall, the book is well managed in view of science and knowledge. This book is very useful for young researchers in the filed of Condensed Matter Physics.
| Mídia | Livros Paperback Book (Livro de capa flexível e brochura) |
| Lançado | 12 de junho de 2012 |
| ISBN13 | 9783659143557 |
| Editoras | LAP LAMBERT Academic Publishing |
| Páginas | 160 |
| Dimensões | 150 × 9 × 226 mm · 256 g |
| Idioma | Alemão |
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