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X-Ray Structure Analysis Theo Siegrist
X-Ray Structure Analysis
Theo Siegrist
This book offers a compact overview on crystallography, symmetry, and applications of symmetry concepts. The author explains the theory behind scattering and diffraction of electromagnetic radiation. X-ray diffraction on single crystals as well as quantitative evaluation of powder patterns are discussed. The book also introduces applications of group theory and tensor properties of crystals.
| Mídia | Livros Paperback Book (Livro de capa flexível e brochura) |
| Lançado | 22 de novembro de 2021 |
| ISBN13 | 9783110610703 |
| Editoras | De Gruyter |
| Páginas | 250 |
| Dimensões | 170 × 240 × 13 mm · 498 g |
| Idioma | Inglês |