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Advanced Scanning Electron Microscopy and X-Ray Microanalysis Softcover reprint of the original 1st ed. 1986 edition
Patrick Echlin
Advanced Scanning Electron Microscopy and X-Ray Microanalysis Softcover reprint of the original 1st ed. 1986 edition
Patrick Echlin
This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.
466 pages, 357 black & white illustrations, 7 colour illustrations, biography
Mídia | Livros Paperback Book (Livro de capa flexível e brochura) |
Lançado | 8 de junho de 2013 |
ISBN13 | 9781475790290 |
Editoras | Springer-Verlag New York Inc. |
Páginas | 454 |
Dimensões | 152 × 229 × 24 mm · 630 g |
Idioma | English |
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