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Matching Properties of Deep Sub-Micron MOS Transistors - The Springer International Series in Engineering and Computer Science Softcover reprint of hardcover 1st ed. 2005 edition
Jeroen A. Croon
Matching Properties of Deep Sub-Micron MOS Transistors - The Springer International Series in Engineering and Computer Science
Jeroen A. Croon
The model is illustrated by dimensioning the unit current cell of a current-steering D/A converter. The most commonly used methods to extract the matching properties of a technology are bench-marked with respect to model accuracy, measurement accuracy and speed, and physical contents of the extracted parameters.
218 pages, biography
| Mídia | Livros Paperback Book (Livro de capa flexível e brochura) |
| Lançado | 1 de dezembro de 2010 |
| ISBN13 | 9781441937186 |
| Editoras | Springer-Verlag New York Inc. |
| Páginas | 206 |
| Dimensões | 160 × 240 × 11 mm · 312 g |
| Idioma | Inglês |
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