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Matching Properties of Deep Sub-Micron MOS Transistors - The Springer International Series in Engineering and Computer Science Softcover reprint of hardcover 1st ed. 2005 edition
Jeroen A. Croon
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Matching Properties of Deep Sub-Micron MOS Transistors - The Springer International Series in Engineering and Computer Science Softcover reprint of hardcover 1st ed. 2005 edition
Jeroen A. Croon
The model is illustrated by dimensioning the unit current cell of a current-steering D/A converter. The most commonly used methods to extract the matching properties of a technology are bench-marked with respect to model accuracy, measurement accuracy and speed, and physical contents of the extracted parameters.
218 pages, biography
| Mídia | Livros Paperback Book (Livro de capa flexível e brochura) |
| Lançado | 1 de dezembro de 2010 |
| ISBN13 | 9781441937186 |
| Editoras | Springer-Verlag New York Inc. |
| Páginas | 206 |
| Dimensões | 160 × 240 × 11 mm · 312 g |
| Idioma | English |
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