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Semiconductor Memories: Technology, Testing, and Reliability
Ashok K. Sharma
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Semiconductor Memories: Technology, Testing, and Reliability
Ashok K. Sharma
Provides in depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods, including: memory cell structures and fabrication technologies; application specific memories and architectures; and memory design, fault modeling and test algorithms, limitations, and trade offs.
480 pages, illustrations
| Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
| Lançado | 10 de setembro de 2002 |
| ISBN13 | 9780780310001 |
| Editoras | John Wiley & Sons Inc |
| Páginas | 480 |
| Dimensões | 183 × 257 × 33 mm · 1,06 kg |
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