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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Wang, Zhong Lin (Georgia Institute of Technology)
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Wang, Zhong Lin (Georgia Institute of Technology)
Entirely self-contained, this book serves as a comprehensive source for graduate students and working scientists using electron microscopy and spectrometry techniques for surface studies. The text is written to combine basic techniques with special applications, theories with experiments giving a complete coverage of RHEED and REM.
456 pages, 224 b/w illus. 10 tables
| Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
| Lançado | 23 de maio de 1996 |
| ISBN13 | 9780521482660 |
| Editoras | Cambridge University Press |
| Páginas | 458 |
| Dimensões | 170 × 244 × 25 mm · 1,10 kg |
Ver tudo de Wang, Zhong Lin (Georgia Institute of Technology) ( por exemplo Paperback Book e Hardcover Book )