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Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition, Lawrence E. Murr 2º edição
Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,
Lawrence E. Murr
The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr
856 pages
| Mídia | Livros Paperback Book (Livro de capa flexível e brochura) |
| Lançado | 29 de outubro de 2019 |
| ISBN13 | 9780367402945 |
| Editoras | Taylor & Francis Ltd |
| Páginas | 856 |
| Dimensões | 150 × 220 × 10 mm · 453 g |
| Idioma | Inglês |
| Editor | Murr, Lawrence E |