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Progress in Nanoscale Characterization and Manipulation - Springer Tracts in Modern Physics Softcover reprint of the original 1st ed. 2018 edition
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Progress in Nanoscale Characterization and Manipulation - Springer Tracts in Modern Physics Softcover reprint of the original 1st ed. 2018 edition
It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy.
508 pages, 26 Illustrations, color; 307 Illustrations, black and white; VII, 508 p. 333 illus., 26 i
| Mídia | Livros Paperback Book (Livro de capa flexível e brochura) |
| Lançado | 11 de janeiro de 2019 |
| ISBN13 | 9789811344206 |
| Editoras | Springer Verlag, Singapore |
| Páginas | 508 |
| Dimensões | 774 g |
| Editor | Bai, Xuedong |
| Editor | Tao, Jing |
| Editor | Wang, Chen |
| Editor | Wang, Rongming |
| Editor | Zhang, Hongzhou |