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Applied Scanning Probe Methods III: Characterization - NanoScience and Technology Softcover reprint of hardcover 1st ed. 2006 edition
Applied Scanning Probe Methods III: Characterization - NanoScience and Technology
There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.
378 pages, 268 black & white illustrations, 2 colour illustrations, 3 black & white tables, biograph
| Mídia | Livros Paperback Book (Livro de capa flexível e brochura) |
| Lançado | 12 de fevereiro de 2010 |
| ISBN13 | 9783642065965 |
| Editoras | Springer-Verlag Berlin and Heidelberg Gm |
| Páginas | 378 |
| Dimensões | 155 × 235 × 21 mm · 639 g |
| Idioma | Alemão |
| Editor | Bhushan, Bharat |
| Editor | Fuchs, Harald |