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Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon - Computational Microelectronics 2004 edition
Peter Pichler
Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon - Computational Microelectronics 2004 edition
Peter Pichler
This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon.
554 pages, 40 black & white illustrations, biography
Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
Lançado | 2 de junho de 2004 |
ISBN13 | 9783211206874 |
Editoras | Springer Verlag GmbH |
Páginas | 554 |
Dimensões | 178 × 254 × 31 mm · 1,18 kg |
Idioma | English German |
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