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Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs Alexandra Zimpeck 2021 edition
Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs
Alexandra Zimpeck
transistor reordering, decoupling cells, Schmitt Trigger, and sleep transistor) as alternatives to attenuate the unwanted effects on FinFET logic cells.
131 pages, 50 Tables, color; 86 Illustrations, color; 3 Illustrations, black and white; XIII, 131 p.
| Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
| Lançado | 11 de março de 2021 |
| ISBN13 | 9783030683672 |
| Editoras | Springer Nature Switzerland AG |
| Páginas | 131 |
| Dimensões | 150 × 220 × 20 mm · 385 g |
| Idioma | Alemão |