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Noise in Nanoscale Semiconductor Devices 2020 edition
Noise in Nanoscale Semiconductor Devices
III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices;Enables readers to design more reliable semiconductor devices;Offers the most up-to-date information on point defects, based on physical microscopic models.
729 pages, 443 Illustrations, color; 107 Illustrations, black and white; VI, 729 p. 550 illus., 443
| Mídia | Livros Paperback Book (Livro de capa flexível e brochura) |
| Lançado | 27 de abril de 2021 |
| ISBN13 | 9783030375027 |
| Editoras | Springer Nature Switzerland AG |
| Páginas | 729 |
| Dimensões | 157 × 233 × 41 mm · 1,08 kg |
| Idioma | Alemão |
| Editor | Grasser, Tibor |