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Quantum Metrology with Photoelectrons: Volume II: Applications and Advances - IOP Concise Physics
Paul Hockett
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Quantum Metrology with Photoelectrons: Volume II: Applications and Advances - IOP Concise Physics
Paul Hockett
The increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. This volume discusses the fundamental concepts along with recent and emerging applications.
125 pages
| Mídia | Livros Paperback Book (Livro de capa flexível e brochura) |
| Lançado | 20 de abril de 2018 |
| ISBN13 | 9781681746890 |
| Editoras | Morgan & Claypool Publishers |
| Páginas | 125 |
| Dimensões | 254 × 180 × 11 mm · 231 g |
| Idioma | English |
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