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Introduction to Focused Ion Beam Nanometrology - IOP Concise Physics
David C. Cox
Introduction to Focused Ion Beam Nanometrology - IOP Concise Physics
David C. Cox
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.
104 pages
Mídia | Livros Paperback Book (Livro de capa flexível e brochura) |
Lançado | 1 de outubro de 2015 |
ISBN13 | 9781681740201 |
Editoras | Morgan & Claypool Publishers |
Páginas | 104 |
Dimensões | 253 × 178 × 8 mm · 163 g |
Idioma | English |
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