Pattern Recognition and Machine Learning: Proceedings of the Japan-U.S. Seminar on the Learning Process in Control Systems, held in Nagoya, Japan August 18-20, 1970 - King-sun Fu - Livros - Springer-Verlag New York Inc. - 9781461575689 - 12 de dezembro de 2012
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Pattern Recognition and Machine Learning: Proceedings of the Japan-U.S. Seminar on the Learning Process in Control Systems, held in Nagoya, Japan August 18-20, 1970 Softcover reprint of the original 1st ed. 1971 edition

King-sun Fu

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Pattern Recognition and Machine Learning: Proceedings of the Japan-U.S. Seminar on the Learning Process in Control Systems, held in Nagoya, Japan August 18-20, 1970 Softcover reprint of the original 1st ed. 1971 edition

This book contains the Proceedings of the US-Japan Seminar on Learning Process in Control Systems. The papers cover a great variety of topics related to learning processes and systems, ranging from pattern recognition to systems identification, from learning control to biological modelling.


344 pages, biography

Mídia Livros     Paperback Book   (Livro de capa flexível e brochura)
Lançado 12 de dezembro de 2012
ISBN13 9781461575689
Editoras Springer-Verlag New York Inc.
Páginas 344
Dimensões 178 × 254 × 18 mm   ·   616 g
Idioma English  
Editor Fu, King-Sun

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