An Artificial Intelligence Approach to Test Generation - The Springer International Series in Engineering and Computer Science - Narinder Singh - Livros - Springer-Verlag New York Inc. - 9781461291831 - 5 de outubro de 2011
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An Artificial Intelligence Approach to Test Generation - The Springer International Series in Engineering and Computer Science Softcover reprint of the original 1st ed. 1987 edition

Narinder Singh

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An Artificial Intelligence Approach to Test Generation - The Springer International Series in Engineering and Computer Science Softcover reprint of the original 1st ed. 1987 edition

I am indebted to my thesis advisor, Michael Genesereth, for his guidance, inspiration, and support which has made this research possible. This research was supported by Schlumberger Palo Alto Research (previously Fairchild Laboratory for Artificial Intelligence).


194 pages, biography

Mídia Livros     Paperback Book   (Livro de capa flexível e brochura)
Lançado 5 de outubro de 2011
ISBN13 9781461291831
Editoras Springer-Verlag New York Inc.
Páginas 194
Dimensões 155 × 235 × 11 mm   ·   303 g
Idioma English  

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