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Test and Diagnosis of Analogue, Mixed-signal and Rf Integrated Circuits: the System on Chip Approach - Materials, Circuits and Devices
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Test and Diagnosis of Analogue, Mixed-signal and Rf Integrated Circuits: the System on Chip Approach - Materials, Circuits and Devices
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book reports systematically the state of the arts and future research directions of those areas.
408 pages, Illustrations
| Mídia | Livros Paperback Book (Livro de capa flexível e brochura) |
| Lançado | 30 de maio de 2008 |
| ISBN13 | 9780863417450 |
| Editoras | Institution of Engineering and Technolog |
| Páginas | 408 |
| Dimensões | 159 × 232 × 23 mm · 612 g |
| Editor | Sun, Yichuang |