Conte aos seus amigos sobre este item:
Characterization of High Tc Materials and Devices by Electron Microscopy
Nigel D Browning
Preço
€ 187,49
Item sob encomenda (no estoque do fornecedor)
Data prevista de entrega 21 - 30 de jan de 2025
O que dizem nossos clientes:
Adicione à sua lista de desejos do iMusic
Também disponível como:
Characterization of High Tc Materials and Devices by Electron Microscopy
Nigel D Browning
This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.
406 pages, 267 b/w illus. 3 tables
| Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
| Lançado | 6 de julho de 2000 |
| ISBN13 | 9780521554909 |
| Editoras | Cambridge University Press |
| Páginas | 406 |
| Dimensões | 170 × 244 × 24 mm · 1,13 kg |
| Editor | Browning, Nigel D. (University of Illinois, Chicago) |
| Editor | Pennycook, Stephen J. (Oak Ridge National Laboratory, Tennessee) |
Ver tudo de Nigel D Browning ( por exemplo Paperback Book e Hardcover Book )