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Advances in Optics of Charged Particle Analyzers: Part 1 - Advances in Imaging and Electron Physics
Advances in Optics of Charged Particle Analyzers: Part 1 - Advances in Imaging and Electron Physics
232 pages
Mídia | Livros Hardcover Book (Livro com lombada e capa dura) |
A ser lançado | 25 de novembro de 2024 |
ISBN13 | 9780443297861 |
Editoras | Elsevier Science Publishing Co Inc |
Páginas | 232 |
Dimensões | 497 g (Peso (estimado)) |
Editor de séries | Hawkes, Peter W. (Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France) |
Editor de séries | Hytch, Martin (Senior Scientist, French National Centre for Research (CNRS), Toulouse, France) |